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Melanie Ooi is an emerging researcher and engineering specialist in Electrical and Electronic Engineering as well as Computer Engineering and Computational Intelligence. She is currently an Associate Professor at Unitec Institute of Technology, New Zealand. While working in close collaboration with several leading multinational electronics companies, she has developed new testing techniques and test data processing methodologies that have been adopted by the industry partners. In the recent years she has also successfully researched on new measurement uncertainty evaluation approaches and frameworks with application to a multitude of science and technology areas (medical research, structural design, mechanical systems modelling, etc.). Her research competence and capability are evident from the extensive and fast growing list of publications, research grants and projects, as well as successfully supervised postgraduate students.
In addition, Associate Professor Ooi was particularly successful in the area of undergraduate and postgraduate education. She introduced several innovations and a well-structured education program enhancing key professional skills and thus increasing work-readiness and employability of engineering graduates that were successfully adopted and implemented by Monash University and RMIT University in their Southeast Asian campuses. They have been strongly supported by multinational electronics companies such as Intel, Freescale Semiconductor and National Instruments.
Her high professional achievements have been acknowledged by several prestigious awards including the Outstanding Young Engineer Award of the Year 2014 from the IEEE Instrumentation and Measurement Society, 2014 Excellence Award from the International Education Association of Australia, 2011 Citation for Outstanding Contributions to Student Learning from the Australian Learning and Teaching Council to mention a few.
She is Senior Member of the IEEE, Member of the IEEE Instrumentation & Measurement Society (I&MS), Distinguished Lecturer and Secretary of the Technical Committee on Fault Tolerant Measurement Systems (TC-32) of the IEEE I&MS. She is also Member of the Institution of Engineering and Technology, and UK Chartered Engineer.